Ultra-high vacuum equipments
Molecular Beam Epitaxy : MBE “MBE-Dai”
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FT-IR (Bruker Optics Vertex 70)
RHEED-gun (Vieetech VE052)
RHEED Image analysis system (K-space KSA400)
Q-mass x2 (Spectra MONITORR; SRS RGA100)
LEED-AES (OCI BDL-600IR)
K-cell x3 (EPI)
Multi(x3) E-gun (Vieetech)
Sputter-gun (ULVAC-PHI USG3)
Ion-source (SPECS IQE 12/38)
Schematic Diagram
Molecular Beam Epitaxy “MBE-Jr.”
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FT-IR (Bomem MB100)
RHEED-gun (Vieetech VE052)
RHEED Image analysis system (K-space KSA400)
Q-mass (Spectra MONITORR)
E-gun (Vieetech)
Sputter-gun (Omegatron OMI-0010)
Arc-plasma gun (ULVAC APS-1)
Schematic Diagram
Molecular Beam Epitaxy “B-NEDO”
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FT-IR (Bomen MB100)
LEED (OCI BDL-400IR)
Evaporation source x2 (AVC)
Arc-plasma gun (ADVANCE-RIKO APS-1)
Sputter-gun (Omegatoron OMI-0043CKE)
Schematic Diagram
UHV Arc-plasma-deposition ”APD”
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Arc-plasma gun x3 (ADVANCE-RIKO APS-1)
RHEED-gun (AVC RDA-005G)
E-gun (AVC)
Sputter-gun (PSP ISIS3000)
Schematic Diagram
UHV Scanning Tunneling Microscopy “UHV-STM” (D3)
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UHV-STM (JEOL JSPM-4500S + SEINAN UHV-EC transfer rod)
X-ray-gun (SPECS XR50)
Electron energy analyser (SPECS PHOIBOS 100 MCD-5)
LEED / Auger Spectrometers (OCI BDL 600IR)
Evasporation source x2 (Beamtron)
Low energy neutral ion gun (Omegatron OMI-0736ND)
Schematic Diagram
Electrochemical Measurement Systems・Surface Structural Evaluation Systems
Scanning Probe Microscope “SPM”
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Bruker Nano MultiMode + halcyonic nano20
Electrochemical Scanning Tunneling Microscope “EC-STM”
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- Bruker Nano MultiMode + Bruker ECM-3
Scanning Tunneling Microscope ”NaioSTM”
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Nanosurf : NaioSTM
Gas Chromatograph for Electroluysis Products “GC”
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Shimazu GC-2014 + Toho Technical Research PS-14 Detector:TCD & FID
Glove Box + Electrochemical Measurement system “Glove Box”
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UNICO + Hokuto HZ-5000,HR301
Schematic Diagram